We introduce a new prototype instrument for measuring the 2D spatially resolved distribution of spectral reflectance based on new spectral imaging technique. The instrument captures digital spectral images of a test sample using a pulsed LED-based monochromatic source and a scientific grade CCD array and special data acquisition algorithm is used to extract the useful image data corresponding to the target application. In earlier version of this instrument, we used a commercial CCD camera with 8-bit ADC without any cooling stages which has many drawbacks. In this work, we have modified our setup by introducing a new scientific grade CCD; deep-cooled interline transfer sensor with 16-bit ADC and electronic shutter. With this new instrument we could achieve a higher accuracy, higher spatially resolved measurements, higher dynamic range, mush better sensitivity and lower uncertainty and we could avoid many sources of errors in the old setup. With one wavelength scan, one can get the full reflectance data of the sample under test which saves a lot of time in comparison with conventional methods. This new instrument is promising with a potential of applications in the field of optical material testing.

Date Published: 1 July 2015
PDF: 4 pages
Proc. SPIE 9655, Fifth Asia-Pacific Optical Sensors Conference, 965503 (1 July 2015); doi: 10.1117/12.2184014

Published in SPIE Proceedings Vol. 9655:
Fifth Asia-Pacific Optical Sensors Conference
Byoungho Lee; Sang-Bae Lee; Yunjiang Rao, Editor(s)