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Proceedings Paper

Analysis of the residual elastic lattice distortion and distribution of dislocation density in structurally inhomogeneous crystals by anomalous transmission of x rays
Author(s): Igor V. Prokopenko
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Paper Abstract

It is shown that contribution to the integrated intensity of x-ray anomalous transmission from the elastic and plastic lattice distortions can be separated. The results of the x-ray investigations allows to determine the dislocation density, relative level and sign of the elastic distortion (lattice curvature) along selected crystallographic directions in a GaAs crystal slab. More detailed confirmation of the method for separation of the lattice distortion and dislocations density contributions to the intensity of x-ray Laue diffraction in high-absorption case was made by investigation of x-ray diffraction integrated intensity as a function of crystal thickness.

Paper Details

Date Published: 1 September 1995
PDF: 7 pages
Proc. SPIE 2521, Time-Resolved Electron and X-Ray Diffraction, (1 September 1995); doi: 10.1117/12.218360
Show Author Affiliations
Igor V. Prokopenko, Institute of Semiconductor Physics (Ukraine)

Published in SPIE Proceedings Vol. 2521:
Time-Resolved Electron and X-Ray Diffraction
Peter M. Rentzepis, Editor(s)

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