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Proceedings Paper

New design for a wavelength demultiplexing device
Author(s): Konrad Bethmann; Rozalia Orghici; Elke Pichler; Urs Zywietz; Thomas Schimdt; Uwe Gleissner; Christian Kelb; Bernhard Roth; Carsten Reinhardt; Ulrike Willer; Wolfgang Schade
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Paper Abstract

Arrayed waveguide gratings (AWG) originally designed as demultiplexing device and manufactured with well established silicon wafer technology are already used successfully as compact spectrometers with high resolution1. In this paper, the concept of a new design for a wavelength demultiplexing device based on tailor-made polymers is presented. The motivation for a new design is a smaller footprint of the device and the avoidance of bended waveguides and the associated losses. Extensive simulations were performed to optimize the design. Using microscope projection lithography and hot embossing a first polymer based device was realized. Its characterization and the achieved performance in terms of resolution and covered wavelength range will be discussed.

Paper Details

Date Published: 3 June 2015
PDF: 7 pages
Proc. SPIE 9480, Fiber Optic Sensors and Applications XII, 948010 (3 June 2015); doi: 10.1117/12.2183328
Show Author Affiliations
Konrad Bethmann, Fraunhofer-Institut für Nachrichtentechnik Heinrich-Hertz-Institut (Germany)
Rozalia Orghici, Clausthal Univ. of Technology (Germany)
Elke Pichler, Clausthal Univ. of Technology (Germany)
Urs Zywietz, Laser Zentrum Hannover e.V. (Germany)
Thomas Schimdt, Univ. of Freiburg (Germany)
Uwe Gleissner, Univ. of Freiburg (Germany)
Christian Kelb, Hannoversches Zentrum für Optische Technologien (Germany)
Bernhard Roth, Hannoversches Zentrum für Optische Technologien (Germany)
Carsten Reinhardt, Laser Zentrum Hannover e.V. (Germany)
Ulrike Willer, Clausthal Univ. of Technology (Germany)
Wolfgang Schade, Fraunhofer-Institut für Nachrichtentechnik Heinrich-Hertz-Institut (Germany)
Clausthal Univ. of Technology (Germany)

Published in SPIE Proceedings Vol. 9480:
Fiber Optic Sensors and Applications XII
Gary Pickrell; Eric Udd; Henry H. Du, Editor(s)

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