
Proceedings Paper
Detection of sub-pixel chessboard corners based on gray symmetry factorFormat | Member Price | Non-Member Price |
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Paper Abstract
In order to solve the robustness and efficiency problems of chessboard corner detection under on-site condition, a method based on the square-closed loop template and local gray symmetry factor is proposed for detecting sub-pixel chessboard corners with high precision and efficiency. Interest points on edges of original image is detected by square-closed loop template according to the transition times on the template, on this basis, corners are roughly detected by averaging the adjacent coordinates of interest points; gray symmetry factors, calculated in the local neighborhood of roughly detected corners, are used as the weighting factors to precisely detect corners on sub-pixel level. Experimental results indicate that computing speed and positioning accuracy of this method was obviously increased. The corner detection performance could be significantly improved using the proposed method.
Paper Details
Date Published: 6 March 2015
PDF: 7 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94464S (6 March 2015); doi: 10.1117/12.2182370
Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)
PDF: 7 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94464S (6 March 2015); doi: 10.1117/12.2182370
Show Author Affiliations
Qiancheng Zhao, Hunan Univ. of Science and Technology (China)
Zhongzhu Chen, Hunan Univ. of Science and Technology (China)
Zhongzhu Chen, Hunan Univ. of Science and Technology (China)
Tianlong Yang, Hunan Univ. of Science and Technology (China)
Yafeng Zhao, Hunan Univ. of Science and Technology (China)
Yafeng Zhao, Hunan Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)
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