Proceedings Paper
Application of high-accuracy laser Doppler velocimeter in self-contained navigation| Format | Member Price | Non-Member Price |
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Paper Abstract
The basic composition and measuring principle of Laser Doppler Velocimeter (LDV) are discussed, and the superiority of LDV been the external velocity observation system of the strapdown inertial navigation system(SINS) is analyzed. For study of the RLG inertial navigation system and the LDV which is self-developed by our own department, the feasibility of SINS/LDV composite system is proved, and vehicle navigation tests have been conducted. Taking the DGPS as reference, the results show that the maximum positioning error of SINS/LDV composite system is 8 meters in one hour test while the maximum positioning error of pure SINS reaches 1130 meters. Results show that the SINS/LDV composite system can effectively inhibits the time accumulated navigation errors, and the high accuracy self-contained navigation can be realized.
Paper Details
Date Published: 22 June 2015
PDF: 7 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95252A (22 June 2015); doi: 10.1117/12.2181973
Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)
PDF: 7 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95252A (22 June 2015); doi: 10.1117/12.2181973
Show Author Affiliations
Chunfeng Gao, National Univ. of Defense Technology (China)
Guo Wei, National Univ. of Defense Technology (China)
Jian Zhou, National Univ. of Defense Technology (China)
Guo Wei, National Univ. of Defense Technology (China)
Jian Zhou, National Univ. of Defense Technology (China)
Qi Wang, National Univ. of Defense Technology (China)
Xingwu Long, National Univ. of Defense Technology (China)
Xingwu Long, National Univ. of Defense Technology (China)
Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)
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