Share Email Print

Proceedings Paper

Design and implementation of an illumination device for optical inspection of defects in glass substrates
Author(s): Ming-Fu Chen; Bo-Cheng Chen; Chih-Wen Chen; Rui-Cian Weng; Ming Chang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A compact and cost-effective illumination platform was developed for a versatile optical inspection system to improve the detection accuracy of defects in glass substrates. The illumination device was developed in two phases, initially to demonstrate its feasibility for surface defect inspection in glass based on dark field images, and subsequently to optimize the design so it can provide multi-directional lighting and increase light scattering from defects on the substrate. Three LED arrays were installed above the substrate carrier and projected at an angle onto the glass substrate for the phase-I illumination device. Surface defects on the glass substrate were successfully reconstructed from images acquired by a line scanned CCD camera, but non-uniformity of defects intensity distribution on images was revealed. To optimize the illumination, two sets of tightly arrayed 3-watt LEDs were symmetrically installed at the entrance slit of the lens-camera module for phase-II illumination device. The inspection data were able to show clearer images of surface defects. The design issues such as poor contrast and sharpness of acquired images due to low scattering efficiency and non-uniform illumination were addressed as well. PCBs for the installation of the LED arrays and their power supply were also optimized. These were manufactured on aluminum substrate to help regulate heating of the inspection platform. This feature makes the system more compact, operable at low power, and easy for modification.

Paper Details

Date Published: 6 March 2015
PDF: 8 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94464B (6 March 2015); doi: 10.1117/12.2181948
Show Author Affiliations
Ming-Fu Chen, Instrument Technology Research Ctr. (Taiwan)
Bo-Cheng Chen, Chung Yuan Christian Univ. (Taiwan)
Chih-Wen Chen, Instrument Technology Research Ctr. (Taiwan)
Rui-Cian Weng, Instrument Technology Research Ctr. (Taiwan)
Ming Chang, Chung Yuan Christian Univ. (Taiwan)

Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?