
Proceedings Paper
Analyzing time walk error of leading trailing edge CFD of timing discrimination for Gaussian and Rayleigh distribution waveformFormat | Member Price | Non-Member Price |
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Paper Abstract
In this study we analyze one of a CFD for timing discrimination. Walk error, drift and precision are the three performance parameters of timing discrimination. The walk error is the most important error type generally. Firstly, we divided the waveform into two types. One is the Gaussian waveform distribution which has three parameters: amplitude, mean, and the pulse width; and the other is Rayleigh waveform distribution which has two parameters: mean and pulse. We analyzed different situations with their changing parameter, and the drift value of time can be obtained for each parameter changing.
Paper Details
Date Published: 6 March 2015
PDF: 7 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 944642 (6 March 2015); doi: 10.1117/12.2181701
Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)
PDF: 7 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 944642 (6 March 2015); doi: 10.1117/12.2181701
Show Author Affiliations
Lijun Dong, Beijing Aerospace Institute for Metrology & Measurement Technology (China)
Ke Liu, Beijing Aerospace Institute for Metrology & Measurement Technology (China)
Lei Guo, Beijing Aerospace Institute for Metrology & Measurement Technology (China)
Ke Liu, Beijing Aerospace Institute for Metrology & Measurement Technology (China)
Lei Guo, Beijing Aerospace Institute for Metrology & Measurement Technology (China)
Yinxiao Miao, Beijing Aerospace Institute for Metrology & Measurement Technology (China)
Liwei Xin, Xi'an Institute of Optics and Precision Mechanics (China)
Liwei Xin, Xi'an Institute of Optics and Precision Mechanics (China)
Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)
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