
Proceedings Paper
Defect structure and optical damage resistance of Zr:Ce:Fe:LiNbO3 crystalsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
The congruent Zr:Ce:Fe:LiNbO3 crystals have been grown by the Czochralski method with fixed concentrations of CeO2 and Fe2O3 and various concentrations of ZrO2. The Ultraviolet(UV)-Visible(Vis) absorption spectra were measured in order to investigate their defect structures and their optical damage resistance was characterized by the transmission light spot distortion method. The results show that the optical damage resistance of the Zr:Ce:Fe:LiNbO3 crystals improves with the doping concentration of ZrO2 increasing. The dependence of the optical damage resistance on the defect structure of Zr:Ce:Fe:LiNbO3 crystals was discussed.
Paper Details
Date Published: 13 April 2015
PDF: 5 pages
Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 95222H (13 April 2015); doi: 10.1117/12.2181652
Published in SPIE Proceedings Vol. 9522:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II
Xiangwan Du; Jennifer Liu; Dianyuan Fan; Jialing Le; Yueguang Lv; Jianquan Yao; Weimin Bao; Lijun Wang, Editor(s)
PDF: 5 pages
Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 95222H (13 April 2015); doi: 10.1117/12.2181652
Show Author Affiliations
Jianqiang Tong, Yanshan Univ. (China)
Jie Gao, Yanshan Univ. (China)
Zhaopeng Xu, Yanshan Univ. (China)
Jie Gao, Yanshan Univ. (China)
Zhaopeng Xu, Yanshan Univ. (China)
Published in SPIE Proceedings Vol. 9522:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II
Xiangwan Du; Jennifer Liu; Dianyuan Fan; Jialing Le; Yueguang Lv; Jianquan Yao; Weimin Bao; Lijun Wang, Editor(s)
© SPIE. Terms of Use
