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Proceedings Paper

A compact “water-window” microscope with 60-nm spatial resolution based on a double stream gas-puff target and Fresnel zone plate optics
Author(s): Przemyslaw Wachulak; Alfio Torrisi; Muhammad Fahad Nawaz; Daniel Adjei; Andrzej Bartnik; Jerzy Kostecki; Łukasz Wegrzynski; Šárka Vondrová; Jana Turňová; Tomasz Fok; Alexandr Jančarek; Henryk Fiedorowicz
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Paper Abstract

Radiation with shorter illumination wavelength allows for extension of the diffraction limit towards nanometer scale, which is a straightforward way to significantly improve a spatial resolution in photon based microscopes. Soft X-ray (SXR) radiation, from the so called ”water window” spectral range, λ=2.3-4.4 nm, which is particularly suitable for biological imaging due to natural optical contrast, providing much better spatial resolution than one obtained with visible light microscopes. The high contrast is obtained because of selective absorption of radiation by carbon and water, being constituents of the biological samples.

We present a desk-top system, capable of resolving 60 nm features in few seconds exposure time. We exploit the advantages of a compact, laser-plasma SXR source, based on a double stream nitrogen gas puff target, developed at the Institute of Optoelectronics, Military University of Technology. The source, emitting quasi-monochromatic, incoherent radiation, in the “water widow” spectral range at λ = 2.88 nm, is coupled with ellipsoidal, grazing incidence condenser and Fresnel zone plate objective. The construction of the microscope with some recent images of test and real samples will be presented and discussed.

Paper Details

Date Published: 12 May 2015
PDF: 8 pages
Proc. SPIE 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV, 95100M (12 May 2015); doi: 10.1117/12.2181431
Show Author Affiliations
Przemyslaw Wachulak, Military Univ. of Technology (Poland)
Alfio Torrisi, Military Univ. of Technology (Poland)
Muhammad Fahad Nawaz, Czech Technical Univ. in Prague (Czech Republic)
Daniel Adjei, Military Univ. of Technology (Poland)
Andrzej Bartnik, Military Univ. of Technology (Poland)
Jerzy Kostecki, Military Univ. of Technology (Poland)
Łukasz Wegrzynski, Military Univ. of Technology (Poland)
Šárka Vondrová, Czech Technical Univ. in Prague (Czech Republic)
Jana Turňová, Czech Technical Univ. in Prague (Czech Republic)
Tomasz Fok, Military Univ. of Technology (Poland)
Alexandr Jančarek, Czech Technical Univ. in Prague (Czech Republic)
Henryk Fiedorowicz, Military Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 9510:
EUV and X-ray Optics: Synergy between Laboratory and Space IV
René Hudec; Ladislav Pina, Editor(s)

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