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Proceedings Paper

Alignment methods for partial compensating lens of aspheric testing in a non-null interferometer
Author(s): Tu Shi; Yongying Yang; Lei Zhang; Dong Liu; Yangjie Chen
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Paper Abstract

Careful alignment of optical elements is essential in interferometric tests. Misalignments of the key element largely influence the testing accuracy. For aspheric figure error testing, non-null tests achieve more flexible and economical measurements than the null ones. However, retrace error is induced due to the violation of null configuration, making the alignment difficult. In aspheric partial compensation testing, the partial compensating lens (PCL) as the key component needs careful adjustment. The aplanat alignment method is effective for the PCL adjusting with high accuracy employing a removable lens, which combined with the PCL as an aplanat. But its structure is complex. After describing this method, a PCL computer-aided alignment (CAA) method is posed basing on system modeling in a ray tracing software. The structure is simplified with computer calculations. The PCL tilt and decentration are easily aligned with a plane and a standard spherical mirror respectively, according to linear relations with wavefront coma aberrations on the detector. Alignment of the PCL was implemented with these two methods in an aspheric partial compensation testing experimental apparatus. Adjustment and aspheric testing results were presented in order. The CAA method is a generalized approach with simpler structure, while the aplanat alignment method is easy to carry out and suitable for industrial application.

Paper Details

Date Published: 6 March 2015
PDF: 8 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94462L (6 March 2015); doi: 10.1117/12.2181177
Show Author Affiliations
Tu Shi, Zhejiang Univ. (China)
Yongying Yang, Zhejiang Univ. (China)
Lei Zhang, Zhejiang Univ. (China)
Dong Liu, Zhejiang Univ. (China)
Yangjie Chen, Hangzhou Zernike Optical Technology Co., Ltd. (China)

Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)

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