
Proceedings Paper
Nonlinear analysis of cylindrical capacitive sensor used for measuring high precision spindle rotation errorsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
A novel cylindrical capacitive sensor (CCS) with differential, symmetrical and integrated structure was proposed to measure multi-degree-of-freedom rotation errors of high precision spindle simultaneously and to reduce impacts of multiple sensors installation errors on the measurement accuracy. The nonlinear relationship between the output capacitance of CCS and the radial gap was derived using the capacitance formula and was quantitatively analyzed. It was found through analysis that the thickness of curved electrode plates led to the existence of fringe effect. The influence of the fringe effect on the output capacitance was investigated through FEM simulation. It was found through analysis and simulation that the CCS could be optimized to improve the measurement accuracy.
Paper Details
Date Published: 6 March 2015
PDF: 10 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94461S (6 March 2015); doi: 10.1117/12.2180838
Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)
PDF: 10 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94461S (6 March 2015); doi: 10.1117/12.2180838
Show Author Affiliations
Kui Xiang, Zhejiang Univ. (China)
Wen Wang, Hangzhou Dianzi Univ. (China)
Min Zhang, Hangzhou Dianzi Univ. (China)
Wen Wang, Hangzhou Dianzi Univ. (China)
Min Zhang, Hangzhou Dianzi Univ. (China)
Keqing Lu, Hangzhou Dianzi Univ. (China)
Zongwei Fan, Hangzhou Dianzi Univ. (China)
Zichen Chen, Zhejiang Univ. (China)
Zongwei Fan, Hangzhou Dianzi Univ. (China)
Zichen Chen, Zhejiang Univ. (China)
Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)
© SPIE. Terms of Use
