
Proceedings Paper
Study on the station-moving measurement technology in the flatness measurement of large annular planes with a Laser TrackerFormat | Member Price | Non-Member Price |
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Paper Abstract
Laser tracker as a three-dimensional measuring instrument for large dimensions is widely used in the industrial measuring system, which is famous for its high precision, high efficiency, in site measurement and easy to be moved or installed, etc. In order to measure the large annular planes, especially non-continuous planes, a method with laser tracker on the basis of station-moving measurement is proposed. In this paper, the working principle of laser tracker system is described firstly, then the principle of the station-moving measurement is analyzed, finally according to the station-moving measurement principle experiment of the flatness measurement of a Φ5000mm round table is carried out, the result is compared with bridge-level, and feasibility of measuring flatness of large precision parts is validated by experiments and analysis results.
Paper Details
Date Published: 6 March 2015
PDF: 6 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94461I (6 March 2015); doi: 10.1117/12.2180817
Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)
PDF: 6 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94461I (6 March 2015); doi: 10.1117/12.2180817
Show Author Affiliations
Wen Zhu, Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Xuedong Cao, Institute of Optics and Electronics (China)
Tian-quan Fan, Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Xuedong Cao, Institute of Optics and Electronics (China)
Tian-quan Fan, Institute of Optics and Electronics (China)
Shi-bin Wu, Institute of Optics and Electronics (China)
Jie Li, Institute of Optics and Electronics (China)
Jie Yang, Institute of Optics and Electronics (China)
Jie Li, Institute of Optics and Electronics (China)
Jie Yang, Institute of Optics and Electronics (China)
Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)
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