
Proceedings Paper
Improved SIFT descriptor applied to stereo image matchingFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Scale Invariant Feature Transform (SIFT) has been proven to perform better on the distinctiveness and robustness than other features. But it cannot satisfy the needs of low contrast images matching and the matching results are sensitive to 3D viewpoint change of camera. In order to improve the performance of SIFT to low contrast images and images with large 3D viewpoint change, a new matching method based on improved SIFT is proposed. First, an adaptive contrast threshold is computed for each initial key point in low contrast image region, which uses pixels in its 9×9 local neighborhood, and then using it to eliminate initial key points in low contrast image region. Second, a new SIFT descriptor with 48 dimensions is computed for each key point. Third, a hierarchical matching method based on epipolar line and differences of key points’ dominate orientation is presented. The experimental results prove that the method can greatly enhance the performance of SIFT to low contrast image matching. Besides, when applying it to stereo images matching with the hierarchical matching method, the correct matches and matching efficiency are greatly enhanced.
Paper Details
Date Published: 6 March 2015
PDF: 7 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94460U (6 March 2015); doi: 10.1117/12.2180667
Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)
PDF: 7 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94460U (6 March 2015); doi: 10.1117/12.2180667
Show Author Affiliations
Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)
© SPIE. Terms of Use
