
Proceedings Paper
Optically transparent fluoro-containing polyimide films with low dielectric permeabilityFormat | Member Price | Non-Member Price |
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Paper Abstract
Optical, dielectric, thermal, physico-mechanical properties of new fluoro-containing alicyclic polyimides were investigated. High optical transparency in visible and UV ranges of the films with thickness 10-25 μm, which lower boundary was registered at 125-260 nm; as well as reflectivity index being 1.492-1.515 were recorded. Dielectric permeability was characterized with low rates and stability up to 300 °С depending on chemical structure. Polyimides were stable with heating in air up to 320-380 °С. Prepared films show break tensile at 145 MPa with elongation up to 50% due to the excellent film-forming properties. Films based on polyimides with polyaniline composition demonstrates reflectivity index 1.60.
Paper Details
Date Published: 18 December 2014
PDF: 6 pages
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944003 (18 December 2014); doi: 10.1117/12.2180429
Published in SPIE Proceedings Vol. 9440:
International Conference on Micro- and Nano-Electronics 2014
Alexander A. Orlikovsky, Editor(s)
PDF: 6 pages
Proc. SPIE 9440, International Conference on Micro- and Nano-Electronics 2014, 944003 (18 December 2014); doi: 10.1117/12.2180429
Show Author Affiliations
V. Kravtsova, A.B. Bekturov Institute of Chemical Science (Kazakhstan)
M. Umersakova, A.B. Bekturov Institute of Chemical Science (Kazakhstan)
R. Iskakov, Kazakh-British Technical Univ. (Kazakhstan)
M. Umersakova, A.B. Bekturov Institute of Chemical Science (Kazakhstan)
R. Iskakov, Kazakh-British Technical Univ. (Kazakhstan)
O. Prikhodko, Al-Farabi Kazakh National Univ. (Kazakhstan)
N. Korobova, National Research Univ. of Electronic Technology (Russian Federation)
N. Korobova, National Research Univ. of Electronic Technology (Russian Federation)
Published in SPIE Proceedings Vol. 9440:
International Conference on Micro- and Nano-Electronics 2014
Alexander A. Orlikovsky, Editor(s)
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