Share Email Print

Proceedings Paper

Development of silicon microforce sensors integrated with double meander springs for standard hardness test instruments
Author(s): Hutomo Suryo Wasisto; Lutz Doering; Alwin Daus; Uwe Brand; Thomas Frank; Erwin Peiner
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Silicon microforce sensors, to be used as a transferable standard for micro force and depth scale calibrations of hardness testing instruments, are developed using silicon bulk micromachining technologies. Instead of wet chemical etching, inductively coupled plasma (ICP) cryogenic deep reactive ion etching (DRIE) is employed in the sensor fabrication process leading to more precise control of 300 μm deep structures with smooth sidewall profiles. Double meander springs are designed flanking to the boss replacing the conventional rectangular springs and thereby improving the system linearity. Two full p-SOI piezoresistive Wheatstone bridges are added on both clamped ends of the active sensors. To realize passive force sensors two spring-mass elements are stacked using glue and photoresist as joining materials. Correspondingly, although plastic deformation seems to occur when the second spring is contacted, the kink effect (i.e., abrupt increase of stiffness) is obviously observed from the first test of the passive stack sensor.

Paper Details

Date Published: 21 May 2015
PDF: 9 pages
Proc. SPIE 9517, Smart Sensors, Actuators, and MEMS VII; and Cyber Physical Systems, 95171X (21 May 2015); doi: 10.1117/12.2180117
Show Author Affiliations
Hutomo Suryo Wasisto, Technische Univ. Braunschweig (Germany)
Lutz Doering, Physikalisch-Technische Bundesanstalt (Germany)
Alwin Daus, Technische Univ. Braunschweig (Germany)
Uwe Brand, Physikalisch-Technische Bundesanstalt (Germany)
Thomas Frank, CiS Forschungsinstitut für Mikrosensorik und Photovoltaik GmbH (Germany)
Erwin Peiner, Technische Univ. Braunschweig (Germany)

Published in SPIE Proceedings Vol. 9517:
Smart Sensors, Actuators, and MEMS VII; and Cyber Physical Systems
José Luis Sánchez-Rojas; Riccardo Brama, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?