
Proceedings Paper
Analysis of system parameters for interferometric imaging spectrometerFormat | Member Price | Non-Member Price |
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Paper Abstract
The technology of interferometric imaging spectrometer can detect spatial information and spectral information of targets simultaneously. It has been the research hotpot because of its advantages of high throughput, high spectral resolution, high spatial resolution and so on. In order to obtain the spectral images of scene at different distance, a system of interferometric imaging spectrometer is presented, which consists of two imaging lens, a collimating lens, a Sagnac transverse shearing splitter and a detector. Based on the analysis of the optical paths and structure of spectrometer, system parameters of interferometric imaging spectrometer were researched, especially the ones of the transverse shearing splitter, incident plane width, mirror offset, optical parallelism error, and the clear aperture of the imaging lens and collimating lens . Optimal system parameters were given by discussing the relationship of parameters including transverse shearing splitter, detection distance, imaging lens, collimating lens and detector. Experimental prototype is set up to verify the impact of the error of system parameters on the imaging properties.
Paper Details
Date Published: 13 April 2015
PDF: 9 pages
Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 95221A (13 April 2015); doi: 10.1117/12.2179847
Published in SPIE Proceedings Vol. 9522:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II
Xiangwan Du; Jennifer Liu; Dianyuan Fan; Jialing Le; Yueguang Lv; Jianquan Yao; Weimin Bao; Lijun Wang, Editor(s)
PDF: 9 pages
Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 95221A (13 April 2015); doi: 10.1117/12.2179847
Show Author Affiliations
Caixun Bai, Nanjing Univ. of Science and Technology (China)
Jianxin Li, Nanjing Univ. of Science and Technology (China)
Xin Meng, Nanjing Univ. of Science and Technology (China)
Jianxin Li, Nanjing Univ. of Science and Technology (China)
Xin Meng, Nanjing Univ. of Science and Technology (China)
Yan Shen, Nanjing Univ. of Science and Technology (China)
Rihong Zhu, Nanjing Univ. of Science and Technology (China)
Rihong Zhu, Nanjing Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 9522:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II
Xiangwan Du; Jennifer Liu; Dianyuan Fan; Jialing Le; Yueguang Lv; Jianquan Yao; Weimin Bao; Lijun Wang, Editor(s)
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