
Proceedings Paper
GaN ultraviolet detector based demonstrator board for UV-index monitoringFormat | Member Price | Non-Member Price |
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Paper Abstract
Currently, various types of III nitride-based materials have been successfully used for short-wavelength optoelectronic devices. The GaN ultraviolet detector has been wildly used for UV-Index(UVI) monitoring, UV curing and water disinfection. The global solar UVI describes the levels of solar UV radiation at the Earth’s surface. The higher the UVI value, the greater the potential damage to the skin and eyes. The UVI monitoring demonstrator board with GaN detector is briefly introduced in this paper.
Paper Details
Date Published: 13 April 2015
PDF: 5 pages
Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 952215 (13 April 2015); doi: 10.1117/12.2179752
Published in SPIE Proceedings Vol. 9522:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II
Xiangwan Du; Jennifer Liu; Dianyuan Fan; Jialing Le; Yueguang Lv; Jianquan Yao; Weimin Bao; Lijun Wang, Editor(s)
PDF: 5 pages
Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 952215 (13 April 2015); doi: 10.1117/12.2179752
Show Author Affiliations
Man Song, China Electronics Technology Group Corp. (China)
Feng Xie, China Electronics Technology Group Corp. (China)
Jun Wang, China Electronics Technology Group Corp. (China)
Feng Xie, China Electronics Technology Group Corp. (China)
Jun Wang, China Electronics Technology Group Corp. (China)
Tanglin Wang, China Electronics Technology Group Corp. (China)
Jin Guo, China Electronics Technology Group Corp. (China)
Jin Guo, China Electronics Technology Group Corp. (China)
Published in SPIE Proceedings Vol. 9522:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II
Xiangwan Du; Jennifer Liu; Dianyuan Fan; Jialing Le; Yueguang Lv; Jianquan Yao; Weimin Bao; Lijun Wang, Editor(s)
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