
Proceedings Paper
Dark counts in superconducting single-photon NbN/NiCu detectorsFormat | Member Price | Non-Member Price |
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Paper Abstract
Nanostripes of hybrid superconductor/ferromagnetic (S/F) NbN/NiCu bilayers and pure superconducting NbN nanostripes have been investigated in dark count experiments. Presence of a ferromagnetic layer influences the superconducting properties of the S/F bilayer, such as the critical current density and the transient photoresponse. The observed significant decrease of the dark-count rate is discussed in terms of vortex-related fluctuation models to shed more light in the intriguing question of the basic mechanism responsible for dark counts in superconducting nanostripe single photon detectors.
Paper Details
Date Published: 6 May 2015
PDF: 5 pages
Proc. SPIE 9504, Photon Counting Applications 2015, 950404 (6 May 2015); doi: 10.1117/12.2179672
Published in SPIE Proceedings Vol. 9504:
Photon Counting Applications 2015
Ivan Prochazka; Roman Sobolewski; Ralph B. James, Editor(s)
PDF: 5 pages
Proc. SPIE 9504, Photon Counting Applications 2015, 950404 (6 May 2015); doi: 10.1117/12.2179672
Show Author Affiliations
L. Parlato, Univ. degli Studi di Napoli Federico II (Italy)
CNR-SPIN, UOS-Napoli (Italy)
Umberto Nasti, Univ. degli Studi di Napoli Federico II (Italy)
M. Ejrnaes, CNR-SPIN, UOS-Napoli (Italy)
R. Cristiano, CNR-SPIN, UOS-Napoli (Italy)
CNR-SPIN, UOS-Napoli (Italy)
Umberto Nasti, Univ. degli Studi di Napoli Federico II (Italy)
M. Ejrnaes, CNR-SPIN, UOS-Napoli (Italy)
R. Cristiano, CNR-SPIN, UOS-Napoli (Italy)
H. Myoren, Saitama Univ. (Japan)
Roman Sobolewski, Institute of Electron Technology (Poland)
Univ. of Rochester (United States)
G. Pepe, Univ. degli Studi di Napoli Federico II (Italy)
CNR-SPIN, UOS-Napoli (Italy)
Roman Sobolewski, Institute of Electron Technology (Poland)
Univ. of Rochester (United States)
G. Pepe, Univ. degli Studi di Napoli Federico II (Italy)
CNR-SPIN, UOS-Napoli (Italy)
Published in SPIE Proceedings Vol. 9504:
Photon Counting Applications 2015
Ivan Prochazka; Roman Sobolewski; Ralph B. James, Editor(s)
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