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Proceedings Paper

Transmission imaging measurements at 188 GHz with 0.35µn CMOS technology
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Paper Abstract

Exelis Geospatial Systems and its CEIS partners at the University of Rochester and Rochester Institute of Technology are developing an active THz imaging system for use in standoff detection, molecular spectroscopy and penetration imaging. The current activity is focused on developing a precision instrument for the detection of radiation centered on atmospheric windows between 200 GHz and 400 GHz (available sources). A transmission imager is developed by raster scanning through a semi-coherent non-ionizing beam, where the beam is incident on a NMOS FET detector. The primary goal of the initial system is to produce a setup capable of measuring responsivity and sensitivity of the detector. The Instrumentation covers the electromagnetic spectral range between 188 GHz and 7.0 THz. Transmission measurements are collected at 188 GHz in order to verify image formation, responsivity and sensitivity as well as demonstrate the active imager’s ability to make penetration images.

Paper Details

Date Published: 13 May 2015
PDF: 7 pages
Proc. SPIE 9483, Terahertz Physics, Devices, and Systems IX: Advanced Applications in Industry and Defense, 94830U (13 May 2015); doi: 10.1117/12.2178512
Show Author Affiliations
Andrew P. Sacco, Exelis Geospatial Systems (United States)
J. Daniel Newman, Exelis Geospatial Systems (United States)
Paul P. K. Lee, Univ. of Rochester (United States)
Kenneth D. Fourspring, Exelis Geospatial Systems (United States)
John H. Osborn, Exelis Geospatial Systems (United States)
Robert D. Fiete, Exelis Geospatial Systems (United States)
Mark V. Bocko, Univ. of Rochester (United States)
Zeljko Ignjatovic, Univ. of Rochester (United States)
Judith L. Pipher, Univ. of Rochester (United States)
Craig W. McMurtry, Univ. of Rochester (United States)
Xi-Cheng Zhang, Univ. of Rochester (United States)
Jagannath Dayalu, Univ. of Rochester (United States)
Katherine Seery, Rochester Institute of Technology (United States)
Chao X. Zhang, Rochester Institute of Technology (United States)
Sahil Bhandari, Rochester Institute of Technology (United States)
Zoran Ninkov, Rochester Institute of Technology (United States)

Published in SPIE Proceedings Vol. 9483:
Terahertz Physics, Devices, and Systems IX: Advanced Applications in Industry and Defense
Mehdi F. Anwar; Thomas W. Crowe; Tariq Manzur, Editor(s)

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