Proceedings Paper
Thin scintillators for ultrafast hard X-ray imaging| Format | Member Price | Non-Member Price |
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Paper Abstract
A multilayer thin-scintillator concept is described for ultrafast imaging. The individual layer thickness is determined by the spatial resolution and light attenuation length, the number of layers is determined by the overall efficiency. By coating the scintillators with a high quantum-efficiency photocathode, single X-ray photon detection can be achieved using fast scintillators with low light yield. The fast, efficient sensors, when combined with MCP and novel nanostructed electron amplification schemes, is a possible way towards GHz hard X-ray cameras for a few frames of images.
Paper Details
Date Published: 6 May 2015
PDF: 11 pages
Proc. SPIE 9504, Photon Counting Applications 2015, 95040N (6 May 2015); doi: 10.1117/12.2178420
Published in SPIE Proceedings Vol. 9504:
Photon Counting Applications 2015
Ivan Prochazka; Roman Sobolewski; Ralph B. James, Editor(s)
PDF: 11 pages
Proc. SPIE 9504, Photon Counting Applications 2015, 95040N (6 May 2015); doi: 10.1117/12.2178420
Show Author Affiliations
Zhehui Wang, Los Alamos National Lab. (United States)
Cris W. Barnes, Los Alamos National Lab. (United States)
Jon S. Kapustinsky, Los Alamos National Lab. (United States)
Chris L. Morris, Los Alamos National Lab. (United States)
Cris W. Barnes, Los Alamos National Lab. (United States)
Jon S. Kapustinsky, Los Alamos National Lab. (United States)
Chris L. Morris, Los Alamos National Lab. (United States)
Ron O. Nelson, Los Alamos National Lab. (United States)
Fan Yang, California Institute of Technology (United States)
Liyuan Zhang, California Institute of Technology (United States)
Ren-Yuan Zhu, California Institute of Technology (United States)
Fan Yang, California Institute of Technology (United States)
Liyuan Zhang, California Institute of Technology (United States)
Ren-Yuan Zhu, California Institute of Technology (United States)
Published in SPIE Proceedings Vol. 9504:
Photon Counting Applications 2015
Ivan Prochazka; Roman Sobolewski; Ralph B. James, Editor(s)
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