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Proceedings Paper

Easy focusing with a sweep frequency target
Author(s): Gerald C. Holst; Stephen W. McHugh
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Paper Abstract

Methods for focusing thermal imaging systems are discussed including visual inspection of resolution targets and edges, maximizing the system response to slits or periodic targets, maximizing the response at a particular spatial frequency, and maximizing the output of an edge detection algorithm. Visual inspection of a sweep frequency is found to be the most efficient method for determining focus in raster scanned systems.

Paper Details

Date Published: 1 October 1990
PDF: 5 pages
Proc. SPIE 1309, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing, (1 October 1990); doi: 10.1117/12.21782
Show Author Affiliations
Gerald C. Holst, Martin Marietta Electronic Sys (United States)
Stephen W. McHugh, Santa Barbara Infrared, Inc. (United States)

Published in SPIE Proceedings Vol. 1309:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing

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