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Proceedings Paper

Reliable pump sources for high-energy class lasers
Author(s): Martin Wölz; Agnieszka Pietrzak; Alex Kindsvater; Jürgen Wolf; Jens Meusel; Ralf Hülsewede; Jürgen Sebastian
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Paper Abstract

High-energy class laser systems operating at high average power are destined to serve fundamental research and commercial applications. System cost is becoming decisive, and JENOPTIK supports future developments with the new range of 500 W quasi-continuous wave (QCW) laser diode bars. In response to different strategies in implementing high-energy class laser systems, pump wavelengths of 880 nm and 940 nm are available. The higher power output per chip increases array irradiance and reduces the size of the optical system, lowering system cost. Reliability testing of the 880 nm laser diode bar has shown 1 Gshots at 500 W and 300 μs pulse duration, with insignificant degradation. Parallel operation in eight-bar diode stacks permits 4 kW pulse power operation. A new high-density QCW package is under development at JENOPTIK. Cost and reliability being the design criteria, the diode stacks are made by simultaneous soldering of submounts and insulating ceramic. The new QCW stack assembly technology permits an array irradiance of 12.5 kW/cm². We present the current state of the development, including laboratory data from prototypes using the new 500 W laser diode in dense packaging.

Paper Details

Date Published: 12 May 2015
PDF: 9 pages
Proc. SPIE 9513, High-Power, High-Energy, and High-Intensity Laser Technology II, 95130E (12 May 2015); doi: 10.1117/12.2178020
Show Author Affiliations
Martin Wölz, JENOPTIK Diode Lab GmbH (Germany)
Agnieszka Pietrzak, JENOPTIK Diode Lab GmbH (Germany)
Alex Kindsvater, Jenoptik Laser GmbH (Germany)
Jürgen Wolf, Jenoptik Laser GmbH (Germany)
Jens Meusel, Jenoptik Laser GmbH (Germany)
Ralf Hülsewede, JENOPTIK Diode Lab GmbH (Germany)
Jürgen Sebastian, JENOPTIK Diode Lab GmbH (Germany)

Published in SPIE Proceedings Vol. 9513:
High-Power, High-Energy, and High-Intensity Laser Technology II
Joachim Hein, Editor(s)

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