Proceedings Paper
Application of image processing for terahertz time domain spectroscopy imaging quantitative detection| Format | Member Price | Non-Member Price |
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Paper Abstract
According to nondestructive testing principle for the terahertz time domain spectroscopy Imaging, using digital image processing techniques, through Terahertz time-domain spectroscopy system collected images and two-dimensional datas and using a range of processing methods, including selecting regions of interest, contrast enhancement, edge detection, and defects being detected. In the paper, Matlab programming is been use to defect recognition of Terahertz, by figuring out the pixels to determine defects defect area and border length, roundness, diameter size. Through the experiment of the qualitative analysis and quantitative calculation of Matlab image processing, this method of detection of defects of geometric dimension of the sample to get a better result.
Paper Details
Date Published: 5 March 2015
PDF: 7 pages
Proc. SPIE 9521, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I, 95211I (5 March 2015); doi: 10.1117/12.2177876
Published in SPIE Proceedings Vol. 9521:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I
Xun Hou; Zhihong Wang; Lingan Wu; Jing Ma, Editor(s)
PDF: 7 pages
Proc. SPIE 9521, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I, 95211I (5 March 2015); doi: 10.1117/12.2177876
Show Author Affiliations
Li-juan Li, Changchun Univ. of Science and Technology (China)
The School of Electro-Optical Engineering (China)
Institute of Photoelectric Measurement and Control Technology (China)
Sheng Wang, Changchun Univ. of Science and Technology (China)
The School of Electro-Optical Engineering (China)
Institute of Photoelectric Measurement and Control Technology (China)
Jiao-jiao Ren, Changchun Univ. of Science and Technology (China)
The School of Electro-Optical Engineering (China)
Institute of Photoelectric Measurement and Control Technology (China)
The School of Electro-Optical Engineering (China)
Institute of Photoelectric Measurement and Control Technology (China)
Sheng Wang, Changchun Univ. of Science and Technology (China)
The School of Electro-Optical Engineering (China)
Institute of Photoelectric Measurement and Control Technology (China)
Jiao-jiao Ren, Changchun Univ. of Science and Technology (China)
The School of Electro-Optical Engineering (China)
Institute of Photoelectric Measurement and Control Technology (China)
Ming-xing Zhou, Changchun Univ. of Science and Technology (China)
The School of Electro-Optical Engineering (China)
Institute of Photoelectric Measurement and Control Technology (China)
Duo Zhao, Changchun Univ. of Science and Technology (China)
The School of Electro-Optical Engineering (China)
Institute of Photoelectric Measurement and Control Technology (China)
The School of Electro-Optical Engineering (China)
Institute of Photoelectric Measurement and Control Technology (China)
Duo Zhao, Changchun Univ. of Science and Technology (China)
The School of Electro-Optical Engineering (China)
Institute of Photoelectric Measurement and Control Technology (China)
Published in SPIE Proceedings Vol. 9521:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I
Xun Hou; Zhihong Wang; Lingan Wu; Jing Ma, Editor(s)
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