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Proceedings Paper

Plasmonic nanoantennas for enhanced midwave and longwave infrared imaging
Author(s): David W. Peters; Paul S. Davids; Jin K. Kim; Thomas E. Beechem; Steven W. Howell; Darin Leonhardt; Taisuke Ohta; Joel R. Wendt; John A. Montoya
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Paper Abstract

Conversion of plane waves to surface waves prior to detection allows key advantages in changes to the architecture of the detector pixels in a focal plane array. We have integrated subwavelength patterned metal nanoantennas with various detector materials to incorporate these advantages: midwave infrared indium gallium arsenide antimonide detectors and longwave infrared graphene detectors.

Nanoantennas offer a means to make infrared detectors much thinner by converting incoming plane waves to more tightly bound and concentrated surface waves. Thinner architectures reduce both dark current and crosstalk for improved performance. For graphene detectors, which are only one or two atomic layers thick, such field concentration is a necessity for usable device performance, as single pass plane wave absorption is insufficient. Using III-V detector material, we reduced thickness by over an order of magnitude compared to traditional devices.

We will discuss Sandia’s motivation for these devices, which go beyond simple improvement in traditional performance metrics. The simulation methodology and design rules will be discussed in detail. We will also offer an overview of the fabrication processes required to make these subwavelength structures on at times complex underlying devices based on III-V detector material or graphene on silicon or silicon carbide. Finally, we will present our latest infrared detector characterization results for both III-V and graphene structures.

Paper Details

Date Published: 22 May 2015
PDF: 6 pages
Proc. SPIE 9467, Micro- and Nanotechnology Sensors, Systems, and Applications VII, 946729 (22 May 2015); doi: 10.1117/12.2177440
Show Author Affiliations
David W. Peters, Sandia National Labs. (United States)
Paul S. Davids, Sandia National Labs. (United States)
Jin K. Kim, Sandia National Labs. (United States)
Thomas E. Beechem, Sandia National Labs. (United States)
Steven W. Howell, Sandia National Labs. (United States)
Darin Leonhardt, Sandia National Labs. (United States)
Taisuke Ohta, Sandia National Labs. (United States)
Joel R. Wendt, Sandia National Labs. (United States)
John A. Montoya, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 9467:
Micro- and Nanotechnology Sensors, Systems, and Applications VII
Thomas George; Achyut K. Dutta; M. Saif Islam, Editor(s)

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