Proceedings Paper
Identifying explosives by dielectric properties obtained through wide-band millimeter-wave illumination| Format | Member Price | Non-Member Price |
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Paper Abstract
A method for extracting dielectric constant from free-space 18 - 40 GHz millimeter-wave reflection data is demonstrated. The reflection coefficient is a function of frequency because of propagation effects, and numerically fitting data to a theoretical model based on geometric optics gives a solution for the complex dielectric constant and target thickness. The discriminative value is illustrated with inert substances and military sheet explosive. In principle, the measurement of reflectivity across multiple frequencies can be incorporated into Advanced Imaging Technology (AIT) systems to automatically identify the composition of anomalies detected on persons at screening checkpoints.
Paper Details
Date Published: 19 May 2015
PDF: 9 pages
Proc. SPIE 9462, Passive and Active Millimeter-Wave Imaging XVIII, 94620F (19 May 2015); doi: 10.1117/12.2177216
Published in SPIE Proceedings Vol. 9462:
Passive and Active Millimeter-Wave Imaging XVIII
David A. Wikner; Arttu R. Luukanen, Editor(s)
PDF: 9 pages
Proc. SPIE 9462, Passive and Active Millimeter-Wave Imaging XVIII, 94620F (19 May 2015); doi: 10.1117/12.2177216
Show Author Affiliations
James C. Weatherall, Battelle Memorial Institute (United States)
Jeffrey Barber, Battelle Memorial Institute (United States)
Jeffrey Barber, Battelle Memorial Institute (United States)
Barry T. Smith, U.S. Dept. of Homeland Security (United States)
Published in SPIE Proceedings Vol. 9462:
Passive and Active Millimeter-Wave Imaging XVIII
David A. Wikner; Arttu R. Luukanen, Editor(s)
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