
Proceedings Paper
Simulation of small footprint full waveform LIDAR propagation through a tree canopy in 3DFormat | Member Price | Non-Member Price |
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Paper Abstract
A Monte Carlo ray tracing simulation of LiDAR propagation has been expanded to 3 dimensions, and makes use of the high-fidelity tree voxel model VoxLAD for realistic simulation of a single tree canopy. The VoxLAD model uses terrestrial LiDAR scanner data to determine Leaf Area Density (LAD) measurements for small volume voxels (~5 – 20 cm side length). The LAD measurement, along with material surface normal orientation information, is used within the Monte Carlo LiDAR propagation model to determine the probability of LiDAR energy being absorbed, transmitted or reflected at each voxel location, and the direction of scattering should an interaction occur. The high spatial fidelity of the VoxLAD models enables simulation of small-footprint LiDAR systems. Results are presented demonstrating incorporation of the VoxLAD model for realistic tree canopy simulation, and the full-waveform simulation capability of the Monte Carlo LiDAR code.
Paper Details
Date Published: 19 May 2015
PDF: 12 pages
Proc. SPIE 9465, Laser Radar Technology and Applications XX; and Atmospheric Propagation XII, 94650K (19 May 2015); doi: 10.1117/12.2177158
Published in SPIE Proceedings Vol. 9465:
Laser Radar Technology and Applications XX; and Atmospheric Propagation XII
Monte D. Turner; Linda M. Wasiczko Thomas; Gary W. Kamerman; Earl J. Spillar, Editor(s)
PDF: 12 pages
Proc. SPIE 9465, Laser Radar Technology and Applications XX; and Atmospheric Propagation XII, 94650K (19 May 2015); doi: 10.1117/12.2177158
Show Author Affiliations
Angela M. Kim, Naval Postgraduate School (United States)
Richard C. Olsen, Naval Postgraduate School (United States)
Richard C. Olsen, Naval Postgraduate School (United States)
Martin Béland, Univ. Laval (Canada)
Published in SPIE Proceedings Vol. 9465:
Laser Radar Technology and Applications XX; and Atmospheric Propagation XII
Monte D. Turner; Linda M. Wasiczko Thomas; Gary W. Kamerman; Earl J. Spillar, Editor(s)
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