
Proceedings Paper
Phase unwrapping of fringe images for dynamic 3D measurements without additional pattern projectionFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Fringe projection is an established method for contactless measurement of 3D object structure. Adversely, the coding of fringe projection is ambiguous. To determine object points with absolute position in 3D space, this coding has to be unique.
We propose a novel approach of phase unwrapping without using additional pattern projection. Based on a stereo camera setup, an image segmentation of each view in areas without height jumps larger than a fringe period is necessary. Within these segments, phase unwrapping is potentially without error. Alignment of phase maps between the two views is realized by an identification process of one correspondence point.
Paper Details
Date Published: 14 May 2015
PDF: 10 pages
Proc. SPIE 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV, 948903 (14 May 2015); doi: 10.1117/12.2176822
Published in SPIE Proceedings Vol. 9489:
Dimensional Optical Metrology and Inspection for Practical Applications IV
Kevin G. Harding; Toru Yoshizawa, Editor(s)
PDF: 10 pages
Proc. SPIE 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV, 948903 (14 May 2015); doi: 10.1117/12.2176822
Show Author Affiliations
Andreas Breitbarth, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Eric Müller, Univ. of Applied Sciences, Jena (Germany)
Peter Kühmstedt, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Eric Müller, Univ. of Applied Sciences, Jena (Germany)
Peter Kühmstedt, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Gunther Notni, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Technische Univ. Ilmenau (Germany)
Joachim Denzler, Friedrich-Schiller-Univ. Jena (Germany)
Technische Univ. Ilmenau (Germany)
Joachim Denzler, Friedrich-Schiller-Univ. Jena (Germany)
Published in SPIE Proceedings Vol. 9489:
Dimensional Optical Metrology and Inspection for Practical Applications IV
Kevin G. Harding; Toru Yoshizawa, Editor(s)
© SPIE. Terms of Use
