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Proceedings Paper

Robust chemical and chemical-resistant material detection using hyper-spectral imager and a new bend interpolation and local scaling HSI sharpening method
Author(s): Hai-Wen Chen; Michael McGurr; Mark Brickhouse
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Paper Abstract

We present new results from our ongoing research activity for chemical threat detection using hyper-spectral imager (HSI) detection techniques by detecting nontraditional threat spectral signatures of agent usage, such as protective equipment, coatings, paints, spills, and stains that are worn by human or on trucks or other objects. We have applied several current state-of-the-art HSI target detection methods such as Matched Filter (MF), Adaptive Coherence Estimator (ACE), Constrained Energy Minimization (CEM), and Spectral Angle Mapper (SAM). We are interested in detecting several chemical related materials: (a) Tyvek clothing is chemical resistance and Tyvek coveralls are one-piece garments for protecting human body from harmful chemicals, and (b) ammonium salts from background could be representative of spills from scrubbers or related to other chemical activities. The HSI dataset that we used for detection covers a chemical test field with more than 50 different kinds of chemicals, protective materials, coatings, and paints. Among them, there are four different kinds of Tyvek material, three types of ammonium salts, and one yellow jugs. The imagery cube data were collected by a HSI sensor with a spectral range of 400–2,500nm. Preliminary testing results are promising, and very high probability of detection (Pd) and low probability of false detection are achieved with the usage of full spectral range (400– 2,500nm). In the second part of this paper, we present our newly developed HSI sharpening technique. A new Band Interpolation and Local Scaling (BILS) method has been developed to improve HSI spatial resolution by 4-16 times with a low-cost high-resolution pen-chromatic camera and a RGB camera. Preliminary results indicate that this new technique is promising.

Paper Details

Date Published: 21 May 2015
PDF: 21 pages
Proc. SPIE 9472, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXI, 94720N (21 May 2015); doi: 10.1117/12.2176713
Show Author Affiliations
Hai-Wen Chen, Booz Allen Hamilton Inc. (United States)
Michael McGurr, Booz Allen Hamilton Inc. (United States)
Mark Brickhouse, Booz Allen Hamilton Inc. (United States)

Published in SPIE Proceedings Vol. 9472:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXI
Miguel Velez-Reyes; Fred A. Kruse, Editor(s)

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