
Proceedings Paper
Screening of adulterants in powdered foods and ingredients using line-scan Raman chemical imagingFormat | Member Price | Non-Member Price |
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Paper Abstract
A newly developed line-scan Raman imaging system using a 785 nm line laser was used to authenticate powdered foods and ingredients. The system was used to collect hyperspectral Raman images in a wavenumber range of 102–2865 cm–1 from three representative food powders mixed with selected adulterants with a concentration of 0.5%, including milk and melamine, flour and benzoyl peroxide, and starch and maleic anhydride. An acoustic mixer was used to create food adulterant mixtures. All the mixed samples were placed in sample holders with a surface area of 50 mm×50 mm. Spectral and image processing algorithms were developed based on single-band images at unique Raman peaks of the individual adulterants. Chemical images were created to show identification, spatial distribution, and morphological features of the adulterant particles mixed in the food powders. The potential of estimating mass concentrations of the adulterants using the percentages of the adulterant pixels in the chemical images was also demonstrated.
Paper Details
Date Published: 13 May 2015
PDF: 9 pages
Proc. SPIE 9488, Sensing for Agriculture and Food Quality and Safety VII, 94880F (13 May 2015); doi: 10.1117/12.2176562
Published in SPIE Proceedings Vol. 9488:
Sensing for Agriculture and Food Quality and Safety VII
Moon S. Kim; Kuanglin Chao; Bryan A. Chin, Editor(s)
PDF: 9 pages
Proc. SPIE 9488, Sensing for Agriculture and Food Quality and Safety VII, 94880F (13 May 2015); doi: 10.1117/12.2176562
Show Author Affiliations
Jianwei Qin, Agricultural Research Service (United States)
Kuanglin Chao, Agricultural Research Service (United States)
Kuanglin Chao, Agricultural Research Service (United States)
Moon S. Kim, Agricultural Research Service (United States)
Published in SPIE Proceedings Vol. 9488:
Sensing for Agriculture and Food Quality and Safety VII
Moon S. Kim; Kuanglin Chao; Bryan A. Chin, Editor(s)
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