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Proceedings Paper

Angle resolved scatter measurement of bulk scattering in transparent ceramics
Author(s): Saurabh Sharma; J. Keith Miller; Ramesh K. Shori; Mark S. Goorsky
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Paper Abstract

Bulk scattering in polycrystalline laser materials (PLM), due to non-uniform refractive index across the bulk, is regarded as the primary loss mechanism leading to degradation of laser performance with higher threshold and lower output power. The need for characterization techniques towards identifying bulk scatter and assessing the quality. Assessment of optical quality and the identification of bulk scatter have been by simple visual inspection of thin samples of PLMs, thus making the measurements highly subjective and inaccurate. Angle Resolved Scatter (ARS) measurement allows for the spatial mapping of scattered light at all possible angles about a sample, mapping the intensity for both forward scatter and back-scatter regions. The cumulative scattered light intensity, in the forward scatter direction, away from the specular beam is used for the comparison of bulk scattering between samples. This technique employ the detection of scattered light at all angles away from the specular beam directions and represented as a 2-D polar map. The high sensitivity of the ARS technique allows us to compare bulk scattering in different PLM samples which otherwise had similar transmitted beam wavefront distortions.

Paper Details

Date Published: 26 March 2015
PDF: 7 pages
Proc. SPIE 9342, Solid State Lasers XXIV: Technology and Devices, 934223 (26 March 2015); doi: 10.1117/12.2175771
Show Author Affiliations
Saurabh Sharma, SPAWAR Systems Ctr. (United States)
Univ. of California, Los Angeles (United States)
J. Keith Miller, Clemson Univ. (United States)
Ramesh K. Shori, SPAWAR Systems Ctr. (United States)
Mark S. Goorsky, Univ. of California, Los Angeles (United States)

Published in SPIE Proceedings Vol. 9342:
Solid State Lasers XXIV: Technology and Devices
W. Andrew Clarkson; Ramesh K. Shori, Editor(s)

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