Share Email Print

Proceedings Paper

A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography
Author(s): V. P. Vavilov; V. V. Shiryaev; A. O. Chulkov
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The proposed algorithm is based on the analysis of an artificial front-surface pixel-based function which includes temperature and time. This function experiences certain extremums, and the corresponding times can be used for determining thermal diffusivity by the formula similar to the known Parker expression. In thermal NDT, such approach being applied to defect areas, provides diffusivity variations which can be used for the evaluation of defect severity in a particular specimen. In this study, both the theoretical basis and the some experimental implementations of the proposed data processing algorithm have been explored to illustrate its validity in thermal properties measurement and thermal NDT, including thermal tomography.

Paper Details

Date Published: 12 May 2015
PDF: 7 pages
Proc. SPIE 9485, Thermosense: Thermal Infrared Applications XXXVII, 94850V (12 May 2015); doi: 10.1117/12.2175645
Show Author Affiliations
V. P. Vavilov, Tomsk Polytechnic Univ. (Russian Federation)
Tomsk State Univ. (Russian Federation)
V. V. Shiryaev, Tomsk Polytechnic Univ. (Russian Federation)
A. O. Chulkov, Tomsk Polytechnic Univ. (Russian Federation)

Published in SPIE Proceedings Vol. 9485:
Thermosense: Thermal Infrared Applications XXXVII
Sheng-Jen (Tony) Hsieh; Joseph N. Zalameda, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?