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Proceedings Paper

256 x 256 PACE-1 PV HgCdTe focal plane arrays for medium and short wavelength IR applications
Author(s): Lester J. Kozlowski; Kadri Vural; V. H. Johnson; J. K. Chen; Robert B. Bailey; Duc Q. Bui; Michael J. Gubala; James Ralph Teague
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Paper Abstract

The development of two 256 by 256 hybrid HgCdTe focal plane array (FPA) families is described, and their performance is discussed. The hybrid FPAs employ a PV HgCdTe detector array and custom Si CMOS readouts. The PACE-1 process was used to fabricate the detectors, whereby the liquid phase epitaxial growth of HgCdTe occurs on sapphire substrates buffered by a layer of CdTe. The performance characteristics of the detector arrays are given. A tactical 256 by 256 CMOS readout is tested, in which a high functional yield was achieved. Updated test results are given for a 256 by 256 readout circuit developed for use in an orbital replacement instrument for the Hubble Space Telescope. The characterizations of several MWIR and SWIR FPAs were thorough and shown to be reliable. The pixel yield, maximum FPA responsivity nonuniformity, and SWIR FPA read noise for the tests are given. The high contrast and insignificant fixed pattern noise of the imagery from the MWIR 256 by 256 FPA are emphasized. These qualities were obtained when the device was operating at 80 k and utilizing f/2 optics with an 8-in. focal length and a 4.4 micron high pass filter.

Paper Details

Date Published: 1 September 1990
PDF: 7 pages
Proc. SPIE 1308, Infrared Detectors and Focal Plane Arrays, (1 September 1990); doi: 10.1117/12.21728
Show Author Affiliations
Lester J. Kozlowski, Rockwell International Corp. (United States)
Kadri Vural, Rockwell International Corp. (United States)
V. H. Johnson, Rockwell International Corp. (United States)
J. K. Chen, Rockwell International Corp. (United States)
Robert B. Bailey, Rockwell International Corp. (United States)
Duc Q. Bui, Rockwell International Corp. (United States)
Michael J. Gubala, Rockwell International Corp. (United States)
James Ralph Teague, Rockwell International Corp. (United States)

Published in SPIE Proceedings Vol. 1308:
Infrared Detectors and Focal Plane Arrays
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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