Share Email Print

Proceedings Paper

Measurement and processing of scattered ultrawideband/short-pulse signals
Author(s): Edward J. Rothwell; Kun Mu Chen; Dennis P. Nyquist; John Ross; Robert Bebermeyer
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

High quality ultrawide-band measurements provide a basis for understanding the transient scattering phenomena necessary for the development of short-pulse radar target identification and detection schemes. This paper describes several techniques used at Michigan State University (MSU) for the acquisition, processing, and interpretation of ultra-wideband scattering data. By performing measurements over a sufficiently large bandwidth, the early- time specular nature of a radar target and the late-time resonant behavior can be observed simultaneously within a single target signature. Special attention has been given at MSU to enhancing the equivalent bandwidth of the measurement system through a spectral slicing and extrapolation method. Observation and interpretation of the various scattering phenomena and their dependance on target aspect are then interpreted through several visualization techniques, including scattering plots, frequency-time plots and images.

Paper Details

Date Published: 18 August 1995
PDF: 12 pages
Proc. SPIE 2562, Radar/Ladar Processing and Applications, (18 August 1995); doi: 10.1117/12.216950
Show Author Affiliations
Edward J. Rothwell, Michigan State Univ. (United States)
Kun Mu Chen, Michigan State Univ. (United States)
Dennis P. Nyquist, Michigan State Univ. (United States)
John Ross, Michigan State Univ. (United States)
Robert Bebermeyer, Michigan State Univ. (United States)

Published in SPIE Proceedings Vol. 2562:
Radar/Ladar Processing and Applications
William J. Miceli, Editor(s)

© SPIE. Terms of Use
Back to Top