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Proceedings Paper

Effects of wavelength-dependent absorption on the polarization of light scattered from marine chlorella
Author(s): Arlon J. Hunt; Mary S. Quinby-Hunt; Daniel B. Shapiro
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Paper Abstract

This paper investigates the wavelength dependence of the polarization characteristics of light scattered from laboratory cultures of marine Clzlorella. Scattering measurements were obtained using a scanning polarization-modulation nephelometer at wavelengths of 457 and 514 nm. The experimental data are corrected for non-spherical contributions and the resulting curves compared to Mie calculations of coated spheres with a Gaussian size distribution. Although the absorption of Chiorella has been reported to be strongly wavelength-dependent in the blue to green region of the spectrum, the scattering behavior changes very little. To verify the sensitivity of the scattering technique to changes in the imaginary refractive index, measurements were performed on absorbing and non-absorbing suspensions of wellcharacterized, coated copolymer particles. In all cases, the angle-dependent measurements and calculations were compared for four elements of the 16 element Mueller scattering matrix at two wavelengths. In the past, comparison of scattering models and measurements were generally performed for only the total intensity (one element of the scattering matrix). The use of four elements provides a much more stringent test of scattering calculations than those based on a single element. Using this method we are able to infer information about the internal structure and refractive indices of microscopic single cell organisms in vivo.

Paper Details

Date Published: 1 September 1990
PDF: 12 pages
Proc. SPIE 1302, Ocean Optics X, (1 September 1990); doi: 10.1117/12.21484
Show Author Affiliations
Arlon J. Hunt, Lawrence Berkeley Lab. (United States)
Mary S. Quinby-Hunt, Univ. of California/Berkeley (United States)
Daniel B. Shapiro, Lawrence Berkeley Lab. (United States)

Published in SPIE Proceedings Vol. 1302:
Ocean Optics X
Richard W. Spinrad, Editor(s)

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