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Proceedings Paper

Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses II: theory
Author(s): Michael D. Feit; Alexander M. Rubenchik; Bruce W. Shore; Brent C. Stuart; Michael D. Perry
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Paper Abstract

Our extensive measurements of damage thresholds for fused silica and several fluorides (LiF, CaF, MgF, and BaF) at 1053 and 526 nm for pulse durations, (tau) , ranging from 275 fs to 1 ns are reported elsewhere at this meeting. A theoretical model based on electron production via multiphoton ionization, Joule heating, and collisional (avalanche) ionization is in good agreement with experimental results.

Paper Details

Date Published: 14 July 1995
PDF: 10 pages
Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, (14 July 1995); doi: 10.1117/12.213727
Show Author Affiliations
Michael D. Feit, Lawrence Livermore National Lab. (United States)
Alexander M. Rubenchik, Lawrence Livermore National Lab. (United States)
Bruce W. Shore, Lawrence Livermore National Lab. (United States)
Brent C. Stuart, Lawrence Livermore National Lab. (United States)
Michael D. Perry, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 2428:
Laser-Induced Damage in Optical Materials: 1994
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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