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Proceedings Paper

Interferometric method for the determination of absolute refractive index and optical thickness
Author(s): S. A. Aleksandrov; I. V. Chernych; Konstantin G. Predko
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Paper Abstract

Goniometric methods of refractive index determination are most frequently used in practice but they require an application of samples with a prism shape. Interferometric methods use samples with parallel plane surfaces but they usually require the knowledge of samples thickness in advance. The proposed interferometric method has not these shortcomings. It is based on use of Rayleigh interferometer providing sample rotation.

Paper Details

Date Published: 23 June 1995
PDF: 1 pages
Proc. SPIE 2208, Refractometry, (23 June 1995); doi: 10.1117/12.213195
Show Author Affiliations
S. A. Aleksandrov, Belorussian Optical and Mechanical Association (Belarus)
I. V. Chernych, Belorussian Optical and Mechanical Association (Belarus)
Konstantin G. Predko, Institute of Applied Optics (Belarus)

Published in SPIE Proceedings Vol. 2208:
Maksymilian Pluta; Mariusz Szyjer, Editor(s)

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