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Proceedings Paper

M-line spectroscopy for nonlinear waveguide characterization
Author(s): Guy Vitrant; Raymond Reinisch; Francois Kajzar
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Paper Abstract

The nonlinear M-line technique is based on the analysis of the nonlinear change in the shape of the dark line associated with the excitation of guided waves. It is an easy technique for the determination of Kerr properties of thin films which can constitute optical waveguides. Full spatio-temporal nonlinear modelization tools have been developed recently for nonlinear waveguide couplers which are used for the determination of the complex nonlinear coefficient of new organic materials.

Paper Details

Date Published: 23 June 1995
PDF: 3 pages
Proc. SPIE 2208, Refractometry, (23 June 1995); doi: 10.1117/12.213176
Show Author Affiliations
Guy Vitrant, LEMO-ENSERG/INPG-CNRS (France)
Raymond Reinisch, LEMO-ENSERG/INPG-CNRS (France)
Francois Kajzar, CEA DEIN/LPEM (France)


Published in SPIE Proceedings Vol. 2208:
Refractometry
Maksymilian Pluta; Mariusz Szyjer, Editor(s)

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