The nonlinear M-line technique is based on the analysis of the nonlinear change in the shape of the dark line associated with the excitation of guided waves. It is an easy technique for the determination of Kerr properties of thin films which can constitute optical waveguides. Full spatio-temporal nonlinear modelization tools have been developed recently for nonlinear waveguide couplers which are used for the determination of the complex nonlinear coefficient of new organic materials.

Date Published: 23 June 1995
PDF: 3 pages
Proc. SPIE 2208, Refractometry, (23 June 1995); doi: 10.1117/12.213176

Published in SPIE Proceedings Vol. 2208:
Refractometry
Maksymilian Pluta; Mariusz Szyjer, Editor(s)