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Proceedings Paper

Statistical algorithm to obtain refractive index and thickness from spectrophotometric interference patterns
Author(s): Fernando Carreno; Eusebio Bernabeu
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Paper Abstract

A statistically based scheme is proposed to analyze the interference pattern obtained by a spectrophotometric system in order to determine the refractive index and the thickness of the sample. The absolute interference order of the interference pattern is determined with the proposed technique. The major approximation inherent in the method is that the layer must be weakly absorbing and non-dispersive over the wavelength region of interest.

Paper Details

Date Published: 23 June 1995
PDF: 11 pages
Proc. SPIE 2208, Refractometry, (23 June 1995); doi: 10.1117/12.213171
Show Author Affiliations
Fernando Carreno, Univ. Complutense (Spain)
Eusebio Bernabeu, Univ. Complutense (Spain)

Published in SPIE Proceedings Vol. 2208:
Maksymilian Pluta; Mariusz Szyjer, Editor(s)

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