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Proceedings Paper

Terrain analysis from visibility metrics
Author(s): Robert F. Richbourg; Clark Ray; Larry L. Campbell
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Paper Abstract

Terrain analysis in support of planned military training or operations in a task which requires considerably training, skill, and experience. Military planners must synthesize knowledge of both their own and their expected adversary's tactics, weapons systems, and probable courses of action to determine key terrain, those portions of the terrain surface which have the most impact on the conduct of tactical operations. Many attributes of the actual terrain influence terrain analyses. These include elevation, intervisibility, vegetation cover, transportation networks, waterways, trafficability, soil types, and others. In some important areas of the world, the large set of attributes that influence terrain analysis is greatly reduced. Desert areas comprise one such areal class. As an example, a high resolution digital elevation model is sufficient to support most terrain analysis efforts for platoon and company operations in the US Marine Corps' dismounted infantry training area at 29 Palms, California. The digital elevation model allows an analysis to characterize each point in the model according to an approximate relative-visibility metric. Determination of key terrain, siting of probable defensive positions, and identification of highly concealed avenues of approach flow from examination of the resulting visibility model. These tactically significant areas can be used to conduct operations planning, perform DEM resolution studies, or help determine selective fidelity parameters for TIN modeling purposes.

Paper Details

Date Published: 5 July 1995
PDF: 12 pages
Proc. SPIE 2486, Integrating Photogrammetric Techniques with Scene Analysis and Machine Vision II, (5 July 1995); doi: 10.1117/12.213129
Show Author Affiliations
Robert F. Richbourg, U.S. Military Academy (United States)
Clark Ray, U.S. Military Academy (United States)
Larry L. Campbell, U.S. Military Academy (United States)

Published in SPIE Proceedings Vol. 2486:
Integrating Photogrammetric Techniques with Scene Analysis and Machine Vision II
David M. McKeown Jr.; Ian J. Dowman, Editor(s)

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