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Proceedings Paper

Reliability of lithium niobate Annealed Proton Exchanged integrated optical circuits
Author(s): Karl M. Kissa; Hogan Eng; David K. Lewis; Vincent D. Rodino; Paul G. Suchoski Jr.; Nancy A. Koziarz
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Paper Abstract

Several studies have been performed recently that demonstrate the reliability of lithium niobate Annealed Proton Exchanged (APE) Integrated Optical Circuits (IOCs). Studies have been performed on APE IOC die as well as pigtailed and packaged devices. The tests indicate that the reliability of APE IOCs meet or surpass the needs of most military and commercial applications.

Paper Details

Date Published: 30 June 1995
PDF: 6 pages
Proc. SPIE 2481, Photonic Device Engineering for Dual-Use Applications, (30 June 1995); doi: 10.1117/12.212700
Show Author Affiliations
Karl M. Kissa, United Technologies Photonics (United States)
Hogan Eng, United Technologies Photonics (United States)
David K. Lewis, United Technologies Photonics (United States)
Vincent D. Rodino, United Technologies Photonics (United States)
Paul G. Suchoski Jr., United Technologies Photonics (United States)
Nancy A. Koziarz, Air Force Rome Lab. (United States)

Published in SPIE Proceedings Vol. 2481:
Photonic Device Engineering for Dual-Use Applications
Andrew R. Pirich, Editor(s)

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