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Proceedings Paper

Perspectives of ion beam polishing of mandrels for x-ray replication optics
Author(s): Mauro Ghigo; Oberto Citterio; Paolo Conconi; Ralf Loi; Francesco Mazzoleni
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Paper Abstract

The optical system requirements for high throughput, high resolution, x-ray telescopes for future space missions that foresee the use of a manufacturing process by replica method, demand a tight control of the shape of the mandrels used for the production of the shells. Since the number of mandrels to be manufactured for a project is generally high, it's also important that the technology adopted for the shape control be cost-effective. With the proposed approach, the aluminum-kanigen mandrels are diamond turned and superpolished to the required microroughness. The final figuring is then obtained with the ion-beam polishing technology that allows the fine tuning of the mandrel shape preserving its microroughness. This method has significant advantages over other conventional figuring processes since no physical load is applied to the mandrel and the material removal function generated from the ion source is stable and repeatable, allowing a deterministic final figuring in one or few passes. A computer simulation of the ion-beam polishing of a mandrel has been executed. An evaluation of the effect of the size of the material removal function used, the final surface error, and the working time required have been obtained.

Paper Details

Date Published: 20 June 1995
PDF: 9 pages
Proc. SPIE 2515, X-Ray and Extreme Ultraviolet Optics, (20 June 1995); doi: 10.1117/12.212628
Show Author Affiliations
Mauro Ghigo, Osservatorio Astronomico di Brera-Milano (Italy)
Oberto Citterio, Osservatorio Astronomico di Brera-Milano (Italy)
Paolo Conconi, Osservatorio Astronomico di Brera-Milano (Italy)
Ralf Loi, Osservatorio Astronomico di Brera-Milano (Italy)
Francesco Mazzoleni, Osservatorio Astronomico di Brera-Milano (Italy)

Published in SPIE Proceedings Vol. 2515:
X-Ray and Extreme Ultraviolet Optics
Richard B. Hoover; Arthur B. C. Walker Jr., Editor(s)

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