
Proceedings Paper
Simple models for the threshold, efficiency, and polarization of AlGaInP red laser diodesFormat | Member Price | Non-Member Price |
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Paper Abstract
The temperature dependence of threshold current and quantum efficiency for GaxIn1- xP (x equals 0.4, 0.6; (lambda) equals 680, 633 nm) single 80 angstrom quantum well lasers is analyzed using a model for the electron leakage current. This model fits the experimental data, correctly describing the rapid increase in threshold and drop in quantum eficiency as temperature increases. Also it indicates that the drift component of the electron leakage current is important, because of the poor p-type conductivity in AlGaInP. In addition, a single quantum well Ga0.5+(delta )In0.5-(delta )P/(AlGa)0.5P laser structure is demonstrated, which can provide similar gain in both polarizations. The slightly-tensile- strained quantum well has the light hole ground state, which gives the lowest transparency current for TM-mode gain. However, the TE-mode gain is dominant at high drive currents. The gain-current relationships have been characterized for each polarization, and found to cross at a modal gain value of 25 cm-1. Lasers whose threshold gain is near this crossover value were found to emit in either one or both polarizations, with a very wide range of polarization assymetry possible. A simple QW gain model can be used to describe this behavior.
Paper Details
Date Published: 19 June 1995
PDF: 12 pages
Proc. SPIE 2399, Physics and Simulation of Optoelectronic Devices III, (19 June 1995); doi: 10.1117/12.212526
Published in SPIE Proceedings Vol. 2399:
Physics and Simulation of Optoelectronic Devices III
Marek Osinski; Weng W. Chow, Editor(s)
PDF: 12 pages
Proc. SPIE 2399, Physics and Simulation of Optoelectronic Devices III, (19 June 1995); doi: 10.1117/12.212526
Show Author Affiliations
David P. Bour, Xerox Palo Alto Research Ctr. (United States)
K. J. Beernink, Xerox Palo Alto Research Ctr. (United States)
K. J. Beernink, Xerox Palo Alto Research Ctr. (United States)
David W. Treat, Xerox Palo Alto Research Ctr. (United States)
Ross D. Bringans, Xerox Palo Alto Research Ctr. (United States)
Ross D. Bringans, Xerox Palo Alto Research Ctr. (United States)
Published in SPIE Proceedings Vol. 2399:
Physics and Simulation of Optoelectronic Devices III
Marek Osinski; Weng W. Chow, Editor(s)
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