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Proceedings Paper

Fractal-based image processing for mine detection
Author(s): Susan R. Nelson; Susan M. Tuovila
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Paper Abstract

A fractal-based analysis algorithm has been developed to perform the task of automated recognition of minelike targets in side scan sonar images. Because naturally occurring surfaces, such as the sea bottom, are characterized by irregular textures they are well suited to modeling as fractal surfaces. Manmade structures, including mines, are composed of Euclidean shapes, which makes fractal-based analysis highly appropriate for discrimination of mines from a natural background. To that end, a set of fractal features, including fractal dimension, was developed to classify image areas as minelike targets, nonmine areas, or clutter. Four different methods of fractal dimension calculation were compared and the Weierstrass function was used to study the effect of various signal processing procedures on the fractal qualities of an image. The difference in fractal dimension between different images depends not only on the physical features extant in the images but in the underlying statistical characteristics of the processing procedures applied to the images and the underlying mathematical assumptions of the fractal dimension calculation methods. For the image set studied, fractal-based analysis achieved a classification rate similar to human operators, and was very successful in identifying areas of clutter. The analysis technique presented here is applicable to any type of signal that may be configured as an image, making this technique suitable for multisensor systems.

Paper Details

Date Published: 20 June 1995
PDF: 12 pages
Proc. SPIE 2496, Detection Technologies for Mines and Minelike Targets, (20 June 1995); doi: 10.1117/12.211342
Show Author Affiliations
Susan R. Nelson, Naval Surface Warfare Ctr. (United States)
Susan M. Tuovila, Naval Surface Warfare Ctr. (United States)

Published in SPIE Proceedings Vol. 2496:
Detection Technologies for Mines and Minelike Targets
Abinash C. Dubey; Ivan Cindrich; James M. Ralston; Kelly A. Rigano, Editor(s)

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