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Proceedings Paper

Phase 2 analysis of Spectralon material for use in on-board calibration systems for the medium-resolution imaging spectrometer (MERIS)
Author(s): James E. Leland; Angelo V. Arecchi
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Paper Abstract

This paper is a report on the ongoing flight evaluation testing of Spectralon, a diffuse reflectance material which is slated for use as a calibration panel for several satellite-based earth-observing instruments. The present study focuses on tests of the stability of the material under exposure to levels of UV/VUV radiation which match those of the low-earth orbit environment. In earlier UV/VUV exposure tests, some degradation of the optical properties of the material were observed; this optical degradation has been linked to photochemical degradation of organic contaminants. A more stringent manufacturing protocol was designed to eliminate these contaminants. The second phase of UV/VUV exposure testing, reported here, was undertaken with the object of validating and optimizing this new manufacturing protocol. Results of this testing indicate that the new manufacturing protocol yields a significant improvement in the optical stability of Spectralon under UV/VUV exposure. These results also indicate that most of the observed degradation is caused by exposure to radiation in the 200 - 380 nm band. This finding suggests new avenues of investigation, as well as providing justification for a simplification of future test requirements.

Paper Details

Date Published: 6 June 1995
PDF: 9 pages
Proc. SPIE 2475, Infrared Detectors and Instrumentation for Astronomy, (6 June 1995); doi: 10.1117/12.211278
Show Author Affiliations
James E. Leland, Labsphere, Inc. (United States)
Angelo V. Arecchi, Labsphere, Inc. (United States)

Published in SPIE Proceedings Vol. 2475:
Infrared Detectors and Instrumentation for Astronomy
Albert M. Fowler, Editor(s)

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