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Proceedings Paper

Polarization monitoring device for the High-Resolution Imaging Spectrometer (HRIS)
Author(s): Horst H. Schwarzer; Fritz Blechinger; Alberto S. Menardi
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Paper Abstract

The requirements concerning the radiometric accuracy of optical remote sensing systems for earth and environmental observations especially to high resolution imaging spectro- radiometers are increasing more and more. Accurate and conscientious on-ground and in-flight calibration of the sensors is one of the baselines to meet this requirement. From this point of view the polarization sensitivity of the sensors plays an important role because it is present more or less every time. Polarization sensitivity and its changes affect directly the radiometric accuracy of the estimated radiances of the polarized radiation coming from the scenes under investigation. In this paper an equipment for in-flight monitoring the polarization sensitivity of the sensor as part of the calibration procedure is presented. It can be used for measuring the plarization state of the incoming radiation too.

Paper Details

Date Published: 12 June 1995
PDF: 6 pages
Proc. SPIE 2480, Imaging Spectrometry, (12 June 1995); doi: 10.1117/12.210872
Show Author Affiliations
Horst H. Schwarzer, DLR-German Aerospace Research Establishment (Germany)
Fritz Blechinger, Daimler-Benz Aerospace AG (Germany)
Alberto S. Menardi, European Space Agency (Netherlands)

Published in SPIE Proceedings Vol. 2480:
Imaging Spectrometry
Michael R. Descour; Jonathan Martin Mooney; David L. Perry; Luanna R. Illing, Editor(s)

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