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Proceedings Paper

Measurement of tracer gas distributions using an open-path FTIR system coupled with computed tomography
Author(s): Anushka C. Drescher; Michael G. Yost; Doo Yong Park; Steven P. Levine; Ashok J. Gadgil; Marc L. Fischer; William W. Nazaroff
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Paper Abstract

Optical remote sensing and iterative computed tomography (CT) can be combined to measure the spatial distribution of gaseous pollutant concentrations in a plane. We have conducted chamber experiments to test this combination of techniques using an Open Path Fourier Transform Infrared Spectrometer (OP-FTIR) and a standard algebraic reconstruction technique (ART). ART was found to converge to solutions that showed excellent agreement with the ray integral concentrations measured by the FTIR but were inconsistent with simultaneously gathered point sample concentration measurements. A new CT method was developed based on (a) the superposition of bivariate Gaussians to model the concentration distribution and (b) a simulated annealing minimization routine to find the parameters of the Gaussians that resulted in the best fit to the ray integral concentration data. This new method, named smooth basis function minimization (SBFM) generated reconstructions that agreed well, both qualitatively and quantitatively, with the concentration profiles generated from point sampling. We present one set of illustrative experimental data to compare the performance of ART and SBFM.

Paper Details

Date Published: 31 May 1995
PDF: 12 pages
Proc. SPIE 2365, Optical Sensing for Environmental and Process Monitoring, (31 May 1995); doi: 10.1117/12.210787
Show Author Affiliations
Anushka C. Drescher, Univ. of California/Berkeley and Lawrence Berkeley Lab. (United States)
Michael G. Yost, Univ. of Washington (United States)
Doo Yong Park, Univ. of Michigan (United States)
Steven P. Levine, Univ. of Michigan (United States)
Ashok J. Gadgil, Lawrence Berkeley Lab. (United States)
Marc L. Fischer, Lawrence Berkeley Lab. (United States)
William W. Nazaroff, Univ. of California/Berkeley and Lawrence Berkeley Lab. (United States)

Published in SPIE Proceedings Vol. 2365:
Optical Sensing for Environmental and Process Monitoring
Orman A. Simpson, Editor(s)

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