Share Email Print

Proceedings Paper

Completion of the scene generation test capability (SGTC) at AEDC
Author(s): Heard S. Lowry III; Parker David Elrod
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The scene generation test capability (SGTC) has achieved an initial operating capability (IOC) at the Arnold Engineering Development Center (AEDC) using direct write scene generation (DWSG). This test tool will be able to present realistic mission scenarios directly to sensor focal plane arrays (FPAs) for developmental and operational test and evaluation (DT&E and OT&E), and will be integrated with the full-up sensor test capabilities at AEDC. The concept validation phase of this program is an operational system that is currently involved in sensor testing. The final phase provides scene projection at three infrared wavelengths and one visible wavelength. The facility is ready for FPA testing. This paper presents an overview of the current SGTC program, including a report of the hardware testing performed as part of the validation process.

Paper Details

Date Published: 2 June 1995
PDF: 12 pages
Proc. SPIE 2469, Targets and Backgrounds: Characterization and Representation, (2 June 1995); doi: 10.1117/12.210596
Show Author Affiliations
Heard S. Lowry III, Micro Craft Technology (United States)
Parker David Elrod, Micro Craft Technology (United States)

Published in SPIE Proceedings Vol. 2469:
Targets and Backgrounds: Characterization and Representation
Wendell R. Watkins; Dieter Clement, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?