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Proceedings Paper

Characterization of post-correction uniformity on infrared focal plane arrays
Author(s): John J. O'Neill III; Christopher R. Costanzo; David R. Kaplan
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Paper Abstract

With increased requirements for better performance being placed on thermal imaging systems, new characterization figures of merit are being developed to assess infrared focal plane array (IRFPA) attributes. Post correction uniformity (PCU) is a parameter that determines how successfully a thermal imaging system can eliminate spatial noise from scanning and staring focal plane arrays. Requirements on PCU, particularly for the more sensitive IRFPAs and applications, are quite rigorous. Test issues of l/f noise, drift, and repeatability become critical and require a rethinking of accepted methods. As infrared sensors have become more sensitive, the need to characterize these focal plane arrays under more controlled and realistic test conditions has emerged. The U.S. Army Night Vision and Electronic SEnsors Directorate (NVESD) has attempted to address these issues by developing a unique capability to measure the PCU of IR focal plane arrays using software algorithms and a specialized mechanical modulator. The modulator is a two foot diameter, two toothed (one reflective and one emissive) blade, which is used to facilitate the real-time collection of test, gain, and offset flux levels. This paper addresses (1) the significance of PCU from a system perspective, (2) discuss the limitations of various PCU measurement techniques, (3) present the NVESD approach for measuring PCU, and (4) report PCU data collected using these techniques.

Paper Details

Date Published: 30 May 1995
PDF: 9 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210556
Show Author Affiliations
John J. O'Neill III, DCS Corp. (United States)
Christopher R. Costanzo, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
David R. Kaplan, U.S. Army Night Vision & Electronic Sensors Directorate (United States)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

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