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Proceedings Paper

Estimating temperature and emissivity for infrared measurements using a PtSi Schottky-barrier infrared CCD image sensor
Author(s): Hiromi Azuma; Tsutomu Endoh; Kazuo Konuma; Yoshitaka Asano; Takanori Tanaka; Nobukazu Teranishi
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Paper Abstract

A new analytical method to estimate temperature and emissivity for infrared measurements is described. There are four steps in the method. First, in calculating the output voltage, the dependence of temperature and emissivity of the object was evaluated. The result was the output voltage increased in proportion to the second power of the object temperature and the dependence of the emissivity was linear for the 250 K to 400 K temperature range. Second, in the fitting of these polynomial equations, the orders of six coefficients were also evaluated. Third, in measuring the output voltage of the standard imaging area, the unit transfer coefficient from digital unit (LSB) to voltage (V) was computed. Finally, an inversion problem for estimating temperature and emissivity of the object was proposed. We have developed a new kind of 3 approximately 5 micrometers band Schottky-barrier infrared CCD image sensor, which we call SCAT648, to verify the validity of the estimating method. The SCAT648 image sensor is composed of the different types of pixels. These pixels have different spectral responsivities and capabilities of measuring target temperature and target emissivity. Four standard temperature-controlled samples were imaged with the newly developed SCAT648 camera system. We estimate the error of the temperature and emissivity measurements to be a low +/- 0.5 K and +/- 5%, respectively.

Paper Details

Date Published: 30 May 1995
PDF: 7 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210546
Show Author Affiliations
Hiromi Azuma, NEC Corp. (Japan)
Tsutomu Endoh, NEC Corp. (Japan)
Kazuo Konuma, NEC Corp. (Japan)
Yoshitaka Asano, NEC Corp. (Japan)
Takanori Tanaka, NEC Corp. (Japan)
Nobukazu Teranishi, NEC Corp. (Japan)

Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

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