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Proceedings Paper

Testing high-performance galvanometer-based optical scanners
Author(s): Bruce E. Rohr
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Paper Abstract

As the speed and accuracy requirements increase for Galvanometer based optical scanners so does the need for higher performance test equipment. This paper summarizes the practice and challenge of designing such instruments.

Paper Details

Date Published: 12 May 1995
PDF: 10 pages
Proc. SPIE 2383, Micro-Optics/Micromechanics and Laser Scanning and Shaping, (12 May 1995); doi: 10.1117/12.209050
Show Author Affiliations
Bruce E. Rohr, Cambridge Technology Inc. (United States)


Published in SPIE Proceedings Vol. 2383:
Micro-Optics/Micromechanics and Laser Scanning and Shaping
M. Edward Motamedi; Leo Beiser, Editor(s)

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